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Backplane Test with External Matrix

Do you want to eliminate multiple test point adaptation cables?

Backplanes typically require a low voltage test with a high pin count. Adapting test points to a backplane can be expensive, unreliable, and time consuming.

For instance, in a 10,000 test point system, using test cards with 64-points, there would be 157 ribbon cables between the test system and the backplane under test. This consumes a considerable amount of time involved when changing to the next device under test, as well as troubleshooting errors found during test. As the system ages, opens found during test are more often caused by the adaptation cables rather than a true failure.

WEETECH has developed a system that uses an external transistor-based matrix. Our premier Backplane/Chassis Test Solutions are designed to bring the test points into direct contact with the backplane under test and eliminate multiple test point adaptation cables. The only cable between the system and the test points is a single control/measurement cable that is daisy chained to each test card.

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