WEETECH's Backplane/Chassis Test Solutions are designed for open, short and component testing of backplanes and chassis. These systems are unique in that they utilize a state-of-the-art external matrix which eliminates the need for complex adaptation cables and brings the test points to the device under test. Also, our transistor switching matrix performs faster than that of our competitors, offering the most efficient testing speed available for high pin counts. Our world-renowned backplane/chassis test systems are fast, accurate, expandable and easy to use.

	W 324 A mid voltage (40 VDC or 250 VDC), portable, backplane test system. Up to 10,240 external test points.
	W 3504 A mid voltage (40 VDC), rack-mount, backplane test system. Up to 307,200 external test points.
	W 3525 A mid voltage (250 VDC), rack-mount, backplane test system. Up to 307,200 external test points.

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