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WK 260 PC with ID-Chip-Detection

Random adaptation instead of fixed test sockets on the test table

Testing requirements

An automotive supplier produces the main harness of a luxury limousine. The special challenge when it comes to the final electrical testing is the high number of different versions of the harnesses to be tested. Instead of a test table with fixed test sockets, the company uses adapter cables. In order to save time and costs, the connectors of the adapter cables should be able to be adapted on the tester side randomly.

 

The plug of the adapter cable is a scalable plug. This allows the use of one-to-one cables that are easy to build.

 

Solution

The ideal tester for this task is the low-voltage tester WK 260 PC. Additionally, it can be extended by WK 260 TC's (test point extensions).

 

Each test point of the WK 260 PC can also read the unique ID of an ID chip without additional hardware and therefore recognizes type and position of all connected adapter cables. This enables the required random connection of the adapter cables to the WK 260 PC.

 

The scan of the ID chips, which runs before the test, identifies all adapter cables connected to the patch panel and creates the pin table required for the test program automatically. This allows the adaption to be changed for each test program without additional programming and without additional work for the operator.

 

Instead of adapter cables, the application is also possible inside the test table with holders.

 

Result / characteristics

For the intermediate adaption a scalable connector system with 10 connection points each is used. This adaption connects the standard output connector of the WK 260 PC with the patch panel. The mating connector to this patch panel is assembled from a few, standardized individual parts according to the number of test points required. The ID chip is also located inside this scalable connector.

Automotive application with the WK 260 PC and ID chip detection
Intermediate adaptation WK 260 PC to patch panel
Scalable plug to test object