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Broad Range of Test Systems at Exhibition in California

WEETECH presented Test Systems for Low Voltage and High Voltage at Space Tech Expo

02.06.2017

Gurnee, IL/Pasadena, CA. This year, the Space Tech Expo took place at the Pasadena Convention Center. Approx. 250 of the most important organisations in the aerospace industry of the United States were squeezing into 24,600 square feet. The American branch of the German WEETECH GmbH brought even four of its well-proven test systems for cable testing and functional testing and presented them on its 100 square feet booth.

 

These included the WK 260 MU and WK 260 PC Testers - the latest test systems of WEETECH - bringing new functionalities into the class of compact low voltage testers. 4-Terminal-Measurement (4-Point-Measurement) to identify very low resistance levels as well as the automatic identification of adaptation holders (ckecker fixtures) with ID-chips are only two examples.

 
At the two high voltage test systems W 444 and W 454 (with distributed test point matrix) and the accompanying CEETIS Programming and Testing Software the participants learned, how simple programming of even complex test scripts can be. Features like the graphical display of the netlist or the automated test script development with the component library lift the opportunities to a new level.


The people at WEETECH have clearly demonstarted at Space Tech Expo, that they focus on their customers during the continuous development of their test systems. New features combined with the proven hardware expand the range of opportunities for applications and further enhance the usability.

 

At the Space Tech Expo WEETECH presented a braod range of test systems - from the compact low voltage tester to the high voltage test system with distributed test point matrix.

At the Space Tech Expo WEETECH presented a braod range of test systems - from the compact low voltage tester to the high voltage test system with distributed test point matrix.